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The effect of solute segregation to deformation twin boundaries on the electrical resistivity of a single-phase superalloy

机译:溶质偏析对单相超合金电阻率的变形双界的影响

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It is critical to control the electrical resistivity of alloys used for wires in harsh environment, e.g. for implanter bio-devices. As-drawn and aged MP35N wires were investigated, exhibiting increasing resistivity with aging time and temperature, in contrast to precipitate-forming alloys. We reveal Cr segregation to deformation twin boundaries upon aging, which effectively facilitates electron scattering and increases the resistivity. Since the diffusion of Cr atoms to these fault planes is rather fast, the larger increment of resistivity occurs very quickly, especially at elevated temperatures. This mechanism is likely active in a wide range of non-dilute alloys that form extended fault planes. (C) 2020 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
机译:例如,控制用于苛刻环境中的电线的电阻率的电阻率至关重要,例如, 用于植入物生物件。 研究了沉淀成合金的老化时间和温度,对绘制和老化的MP35N电线进行了增强的电阻率。 我们揭示了在老化时对变形双界的Cr偏析,从而有效促进电子散射并增加电阻率。 由于Cr原子的扩散到这些故障平面相当快,因此电阻率较大的电阻率较大,特别是在升高的温度下。 该机制可能在各种非稀释合金中活跃,形成延长的故障平面。 (c)2020 Acta Materialia Inc. eSeryvier有限公司发布所有权利。

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