Radiation forces exerted on redundant particles on an optical surface

摘要

The effective removal of micro-/nanometers redundant particles is a challenging problem for improving the optical surface performance and reliability. The radiation forces(RFs) exerted on the redundant particles by an incident Gaussian laser beam are derived on the basis of generalized Lorenz-Mie theory combining with the scattering theory. The analytical expressions of the axial RFs and the transverse RFs are provided according to the relationship between spherical vector wave functions and triangle functions. The variations of the axial and transverse components of RFs with the beam waist widths, radius, refractive index, and off-axial distance are numerically analyzed. The results provide a theoretical and technological basis for clearing and controlling the redundant particle more efficiently in the nondestructive examination project.