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Detection of weak near-infrared optical imaging signals under ambient light by optical parametric amplification

机译:通过光学参数放大在环境光下检测弱近红外光学成像信号

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摘要

We present a detection method based on optical parametric amplification to amplify and detect near-infrared (NIR) optical imaging signals. A periodically poled lithium niobate crystal is employed as an optical parametric amplifier (OPA), which provides excellent quasi-phase-matching conditions for the optical parametric amplification process. A weak reflectance imaging signal at 1465 nm is amplified by the OPA with a high gain of up to 92 dB, and the amplified optical signal is detected with a low-cost photodetector under ambient light conditions. Such a high gain leads to a detection limit of 23 pW under a 5 MHz detection bandwidth, which is remarkably lower than the theoretical value of a NIR photomukiplier tube (PMT). By exploiting the advantages of the OPA, the incident power needed for microscopy or imaging is reduced by 40-60 dB. The high imaging gain of the OPA also significantly enhances the imaging penetration depth by selectively detecting the weak signal reflected from deep tissue structures. The successful implementation of the OPA enables a robust and sensitive detection method that offers the potential to replace PMTs in imaging applications within the NIR spectral range. (C) 2019 Optical Society of America
机译:我们介绍了一种基于光学参数放大的检测方法,以放大和检测近红外(NIR)光学成像信号。使用周期性极化的铌酸锂晶体作为光学参数放大器(OPA),其为光学参数扩增过程提供了优异的准相位匹配条件。通过高达92dB的高增益的OPA放大1465nm处的弱反射率成像信号,并且在环境光条件下用低成本光电探测器检测放大的光信号。在5MHz检测带宽下,这种高增益导致23PW的检出限为23PW,这显着低于Nir光孔管(PMT)的理论值。通过利用OPA的优点,显微镜或成像所需的入射功率降低了40-60dB。通过选择性地检测从深组织结构反射的弱信号,OPA的高成像增益也显着增强了成像渗透深度。 OPA的成功实现使得能够稳健和敏感的检测方法,其提供替代在NIR光谱范围内的成像应用中的PMT。 (c)2019年光学学会

著录项

  • 来源
    《Optics Letters》 |2019年第17期|共4页
  • 作者单位

    Univ Illinois Beckman Inst Adv Sci &

    Technol Urbana IL 61801 USA;

    Univ Illinois Beckman Inst Adv Sci &

    Technol Urbana IL 61801 USA;

    Univ Illinois Beckman Inst Adv Sci &

    Technol Urbana IL 61801 USA;

    Univ Illinois Beckman Inst Adv Sci &

    Technol Urbana IL 61801 USA;

    Univ Illinois Beckman Inst Adv Sci &

    Technol Urbana IL 61801 USA;

    Univ Illinois Beckman Inst Adv Sci &

    Technol Urbana IL 61801 USA;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 计量学;光学;
  • 关键词

  • 入库时间 2022-08-19 17:51:48

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