首页> 外文期刊>Nanotechnology >Hybrid nanomembrane-based capacitors for the determination of the dielectric constant of semiconducting molecular ensembles
【24h】

Hybrid nanomembrane-based capacitors for the determination of the dielectric constant of semiconducting molecular ensembles

机译:基于混合的纳米膜基电容器,用于确定半导体分子集合的介电常数

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

Considerable advances in the field of molecular electronics have been achieved over the recent years. One persistent challenge, however, is the exploitation of the electronic properties of molecules fully integrated into devices. Typically, the molecular electronic properties are investigated using sophisticated techniques incompatible with a practical device technology, such as the scanning tunneling microscopy. The incorporation of molecular materials in devices is not a trivial task as the typical dimensions of electrical contacts are much larger than the molecular ones. To tackle this issue, we report on hybrid capacitors using mechanically-compliant nanomembranes to encapsulate ultrathin molecular ensembles for the investigation of molecular dielectric properties. As the prototype material, copper (II) phthalocyanine (CuPc) has been chosen as information on its dielectric constant (k(CuPc)) at the molecular scale is missing. Here, hybrid nanomembrane-based capacitors containing metallic nanomembranes, insulating Al2O3 layers, and the CuPc molecular ensembles have been fabricated and evaluated. The Al2O3 is used to prevent short circuits through the capacitor plates as the molecular layer is considerably thin ( 30 nm). From the electrical measurements of devices with molecular layers of different thicknesses, the CuPc dielectric constant has been reliably determined (k(CuPc) = 4.5 +/- 0.5). These values suggest a mild contribution of the molecular orientation on the CuPc dielectric properties. The reported nanomembrane-based capacitor is a viable strategy for the dielectric characterization of ultrathin molecular ensembles integrated into a practical, real device technology.
机译:在近年来已经实现了分子电子领域的相当大的进展。然而,一个持续挑战是利用完全集成到设备中的分子的电子性质。通常,使用与实际器件技术不符合的复杂技术来研究分子电子特性,例如扫描隧道显微镜。由于电触点的典型尺寸远大于分子器,因此装置中的分子材料的掺入不是琐碎的任务。为了解决这个问题,我们使用机械柔顺的纳米爆炸报告混合电容器,以将超薄分子集合封装进行分子介电性质的研究。作为原型材料,已选择铜(II)铜(II)酞菁(CUPC)作为其在分子尺度的介电常数(K(CUPC))上的信息缺失。这里,已经制造并评估了含有金属纳米爆炸,绝缘Al 2 O 3层,绝缘Al2O3层和Cupc分子集合的杂种纳米膜基电容器。 Al2O3用于防止通过电容器板的短路,因为分子层相当薄(& 30nm)。从具有不同厚度的分子层的装置的电气测量,已经可靠地确定CUPC介电常数(K(CUPC)= 4.5 +/- 0.5)。这些值表明了分子取向对CUPC电介质性质的温和贡献。报告的基于纳米膜的电容器是介质用于集成到实用,真实的设备技术中的超薄分子集合的介电表征的可行策略。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号