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Current-gain in FETs beyond cut-off frequency

机译:截止频率超出FET的电流增益

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Driven by the fast-growing demand for high-frequency applications, electronics engineers are steadily pushing transistor technologies beyond their high-frequency limits. A key figure of merit to quickly assess the potential of a transistor for high-frequency applications is given by the cut-off frequency (f(T)) that is defined as the frequency at which the short-circuit current-gain (h(21)) drops to unity. However, field-effect transistors (FETs) can exhibit a current-gain even at frequencies beyond f(T), due to the resonance of the extrinsic reactive contributions leading to a peak in the magnitude of h(21). Based on an extensive analysis, this letter aims to demonstrate that, although not all FETs exhibit such a current-gain peak at frequencies beyond f(T), this effect is inherent in any FET devices and its appearance simply depends on the specific amount of the extrinsic reactive contributions, besides to the operating frequency.
机译:由快速增长的高频应用需求驱动,电子工程师正在稳步推动超出其高频限制的晶体管技术。 快速评估高频应用晶体管电位的关键数字由截止频率(f(t))定义为短路电流增益(H( 21))降至统一。 然而,现场效应晶体管(FET)即使在F(t)之外的频率上也可以表现出电流增益,因为外在的反应贡献导致H(21)的大小的峰值的峰值的谐振。 基于广泛的分析,这封信旨在证明,尽管并非所有FET在F(t)之外的频率下表现出这样的电流增益峰值,但这种效果是在任何FET器件中固有的,其外观简单地取决于特定量 外部反应性贡献,除了运行频率。

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