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Electric double-layer transistors: a review of recent progress

机译:双电层晶体管:最新进展回顾

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With the miniaturization of electronic devices, it is essential to achieve higher carrier density and lower operation voltage in field-effect transistors (FETs). However, this is a great challenge in conventional FETs owing to the low capacitance and electric breakdown of gate dielectrics. Recently, electric double-layer technology with ultra-high charge-carrier accumulation at the semiconductor channel/electrolyte interface has been creatively introduced into transistors to overcome this problem. Some interesting electrical transport characteristics such as superconductivity, metal-insulator transition, and tunable thermoelectric behavior have been modulated both theoretically and experimentally in electric double-layer transistors (EDLTs) with various semiconductor channel layers and electrolyte materials. The present article is a review of the recent progress in the EDLTs and the impacts of EDLT technology on modulating the charge transportation of various electronics.
机译:随着电子设备的小型化,必不可少的是在场效应晶体管(FET)中实现更高的载流子密度和更低的工作电压。然而,由于低电容量和栅极电介质的电击穿,这在常规FET中是一个巨大的挑战。近来,已经将具有在半导体沟道/电解质界面处的超高电荷载流子积累的双电层技术创造性地引入到晶体管中以克服该问题。理论上和实验上,在具有各种半导体沟道层和电解质材料的双电层晶体管(EDLT)中,已经对一些有趣的电传输特性(如超导性,金属-绝缘体转变和可调节的热电行为)进行了调制。本文回顾了EDLT的最新进展以及EDLT技术对调制各种电子器件的电荷传输的影响。

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