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首页> 外文期刊>Journal of Materials Science >Microstructure, electrical properties, and dc aging characteristics of Tb4O7-doped ZnO-based varistors
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Microstructure, electrical properties, and dc aging characteristics of Tb4O7-doped ZnO-based varistors

机译:Tb4O7掺杂的ZnO基压敏电阻的微观结构,电性能和dc老化特性

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摘要

The microstructure, electrical properties, and dc-accelerated aging characteristics of Tb4O7-doped ZnO-based varistors were investigated for different Tb4O7 amounts and sintering temperatures. The sintered density increased with increasing Tb4O7 amount and sintering temperature. The average grain size decreased with increasing Tb4O7 amount and increased with increasing sintering temperature. The varistor voltage and nonlinear coefficient increased with increasing Tb4O7 amount and decreased with increasing sintering temperature. The stability was worse with increasing Tb4O7 amount for the varistors sintered at 1,300 C. The 0.5 mol% Tb4O7-doped varistors sintered at 1,350 C exhibited a good stability for dc-accelerated aging stress of 0.95 V (1 mA)/150 C/24 h.
机译:研究了不同Tb4O7用量和烧结温度下掺Tb4O7的ZnO基压敏电阻的微观结构,电性能和直流加速老化特性。烧结密度随Tb4O7含量和烧结温度的增加而增加。随着Tb4O7含量的增加,平均晶粒尺寸减小,而随着烧结温度的增加,平均晶粒尺寸增加。压敏电阻电压和非线性系数随Tb4O7含量的增加而增加,随烧结温度的升高而降低。在1,300 C下烧结的压敏电阻,随着Tb4O7量的增加,稳定性变差。在1,350 C下烧结的0.5 mol%掺杂Tb4O7的压敏电阻对于0.95 V(1 mA)/ 150 C / 24的直流加速老化应力表现出良好的稳定性。 H。

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