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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Electronic properties of MoS2 on monolayer, bilayer and bulk SiC: A density functional theory study
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Electronic properties of MoS2 on monolayer, bilayer and bulk SiC: A density functional theory study

机译:MoS2在单层,双层和块状SiC上的电子性质:密度泛函理论研究

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摘要

The structure and electronic properties of MoS2 and SiC (single-layer SiC, double layer SiC, C-terminated SiC and Si-terminated SiC) composites were investigated by using density functional theory calculations. The calculation results show that the electronic properties of MoS2 are modified at different levels by combining with different thickness of SiC. The heterostructures (MoS2/C-terminated SiC and MoS2/Si-terminated SiC) possess larger binding energies than MoS2/single-layer SiC and MoS2/bilayer SiC, suggesting the higher stability for MoS2/C-terminated SiC and MoS2/Si-terminated SiC composites. It is found that charge transfer is from SiC to MoS2 in these heterostructures. MoS2/single-layer SiC, MoS2/double-layer SiC and MoS2/C-terminated SiC are semiconductors, whereas MoS2/Si-terminated SiC has no gap. (C) 2016 Elsevier B.V. All rights reserved.
机译:利用密度泛函理论计算研究了MoS2和SiC(单层SiC,双层SiC,C端基SiC和Si端基SiC)复合材料的结构和电子性能。计算结果表明,通过结合不同厚度的SiC,MoS2的电子性能在不同的水平上得到了改善。异质结构(MoS2 / C端接的SiC和MoS2 / Si端接的SiC)比MoS2 /单层SiC和MoS2 /双层SiC具有更大的结合能,这表明MoS2 / C端接的SiC和MoS2 / Si-具有更高的稳定性。端接的SiC复合材料。发现在这些异质结构中电荷从SiC转移到MoS2。 MoS 2 /单层SiC,MoS 2 /双层SiC和MoS 2 / C封端的SiC是半导体,而MoS 2 / Si封端的SiC没有间隙。 (C)2016 Elsevier B.V.保留所有权利。

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