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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Improvement of the optoelectronic properties of tin oxide transparent conductive thin films through lanthanum doping
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Improvement of the optoelectronic properties of tin oxide transparent conductive thin films through lanthanum doping

机译:镧掺杂改善氧化锡透明导电薄膜的光电性能

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This work highlights some physical investigations on tin oxide thin films doped with different lanthanum content (ratio Laeto-Sn = 0-3%). Such doped thin films have been successfully grown by spray pyrolysis onto glass substrates at 450 degrees C. X-ray diffraction (XRD) patterns showed that SnO2: La thin films were polycrystalline with tetragonal crystal structure. The preferred orientation of crystallites for undoped SnO2 thin film was along (110) plane, whereas La-doped ones have rather preferential orientations along (200) direction. Although the grain size values exhibited a decreasing tendency with increasing doping content confirming the role of La as a grain growth inhibitor, dislocation density and microstrain values showed an increasing tendency. Also, Raman spectroscopy shows the bands corresponding to the tetragonal structure for the entire range of La doping. The same technique confirms the presence of La2O3 as secondary phase. Moreover, SEM images showed a porous architecture with presence of big clusters with different sizes and shapes resulting from the agglomeration of small grains round shaped. Photoluminescence spectra of SnO2: La thin films exhibit a decrease in the emission intensity with La concentration due to the decrease in grain size. Optical transmittance spectra of the films showed high transparency (similar to 80%) in the visible region. The dispersion of the refractive index is discussed using both Cauchy model and Wemple-Di-Domenico method. The optical band gap values vary slightly with La doping and were found to be around 3.8 eV. It has been found that La doping causes a pronounced decrease in the sheet resistance by up to two orders of magnitude and allows improving the Haacke's figure of merit (phi) of the sprayed thin films. Moreover, we have introduced for a first time a new figure of merit for qualifying photo-thermal conversion applications. The obtained high conducting and transparent SnO2: La thin films are promising to be useful in various optoelectronic applications. (C) 2016 Elsevier B.V. All rights reserved.
机译:这项工作重点介绍了对掺杂有不同镧含量(比率Laeto-Sn = 0-3%)的氧化锡薄膜的一些物理研究。这种掺杂的薄膜已经通过在450摄氏度下喷雾热解成功地生长到玻璃基板上。X射线衍射(XRD)图案显示SnO2:La薄膜是具有四方晶体结构的多晶。对于未掺杂的SnO2薄膜,微晶的首选取向是沿(110)平面,而掺杂La的微晶的取向优选沿(200)方向。尽管随着掺杂含量的增加晶粒尺寸值呈现出减小的趋势,这证实了La作为晶粒生长抑制剂的作用,但是位错密度和微应变值呈现出增大的趋势。同样,拉曼光谱显示出在整个La掺杂范围内对应于四方结构的能带。相同的技术证实了La2O3作为第二相的存在。此外,SEM图像显示出多孔结构,其由于小颗粒的团聚而存在具有不同尺寸和形状的大簇。由于晶粒尺寸的减小,SnO2:La薄膜的光致发光光谱显示出随着La浓度的降低发光强度。薄膜的透光光谱在可见光区域显示出高透明度(约80%)。使用柯西模型和Wemple-Di-Domenico方法讨论了折射率的色散。光学带隙值随La掺杂而略有变化,发现约为3.8 eV。已经发现,La掺杂导致薄层电阻明显降低多达两个数量级,并且可以改善喷涂薄膜的Haacke品质因数(phi)。此外,我们首次为合格的光热转换应用引入了新的品质因数。获得的高导电性和透明的SnO2:La薄膜有望在各种光电应用中使用。 (C)2016 Elsevier B.V.保留所有权利。

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