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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Effect of Cr alloying interlayer on the interfacial bond strength of CuW/CuCr integral materials
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Effect of Cr alloying interlayer on the interfacial bond strength of CuW/CuCr integral materials

机译:Cr合金中间层对CuW / CuCr整体材料界面结合强度的影响

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The effects of Cr alloying interlayer on the microstructure and mechanical properties of the dissimilar CuW/CuCr joints prepared by sintering-infiltration method were studied. The hardness and electrical conductivity of the CuCr alloy side and the tensile strength of the CuW/CuCr integral materials were tested. The interfacial microstructure and fracture morphology of the CuW/CuCr joints were characterized by X-ray diffraction, optical microscopy, scanning electron microscope equipped with energy dispersive spectrometry. The results show that both the electrical conductivity and hardness of the CuCr alloy side of the aged CuW/CuCr joints are higher than those in the solid solution and infiltration condition. With increase of the Cr content, the regions of eutectic phase are expanded gradually on the CuCr alloy side, and the morphology of Cr particles changes from spot shape to rod-like shape. The highest interfacial bond strength can reach up to 446.66 MPa when Cu-15 wt% Cr alloy is introduced into the interfacial region between CuW and Cu-Cr alloy. The interfacial fracture morphology presents more cleavage fractures of W particles, and the Cu/W interphase has a good metallurgical bond. (C) 2016 Elsevier B.V. All rights reserved.
机译:研究了Cr合金夹层对烧结渗流法制备的CuW / CuCr异种接头组织和力学性能的影响。测试了CuCr合金侧的硬度和导电率以及CuW / CuCr整体材料的拉伸强度。通过X射线衍射,光学显微镜,配备能谱仪的扫描电子显微镜对CuW / CuCr接头的界面微观结构和断裂形态进行了表征。结果表明,时效CuW / CuCr接头的CuCr合金侧的电导率和硬度均高于固溶和渗透条件下的电导率和硬度。随着Cr含量的增加,CuCr合金侧的共晶相区域逐渐扩大,Cr颗粒的形态从点状变为棒状。当Cu-15 wt%Cr合金引入CuW和Cu-Cr合金之间的界面区域时,最高的界面结合强度可以达到446.66 MPa。界面断裂形态表现出更多的W颗粒断裂断裂,且Cu / W相具有良好的冶金结合。 (C)2016 Elsevier B.V.保留所有权利。

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