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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Lateral parameter variations on the properties of La_(0.7)Sr_(0.3)MnO_3 films prepared on Si (1 0 0) substrates by dc magnetron sputtering
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Lateral parameter variations on the properties of La_(0.7)Sr_(0.3)MnO_3 films prepared on Si (1 0 0) substrates by dc magnetron sputtering

机译:直流磁控溅射在Si(1 0 0)衬底上制备的La_(0.7)Sr_(0.3)MnO_3薄膜的横向参数变化

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摘要

La_(0.7)Sr_(0.3)MnO_3 (LSMO) is an interesting colossal magnetoresistance material for application in electronic and spintronics devices. A phenomenon in the planner magnetron sputtering of the LSMO films that is not well investigated as yet are the laterally non-uniform film properties resulting from the laterally inhomogeneous erosion of the target material, whereby the lateral distribution of the film properties depend strongly on the deposition parameters. The lateral distributions of the electrical, magnetic and structural properties ofLSMOfilms prepared by dc magnetron sputtering on Si substrates are investigated across a distance of 64mmusing four-point probe, vibrating sample magnetometer and X-ray diffraction.In room temperature the T_(MI) and T_c of this film without any additional buffer layer are 245K and 325 K,respectively, which makes them very interesting as spin source in Si based technology. Hence, it seems that sputter deposited LSMO is a promising CMR materials for spintronics devices.
机译:La_(0.7)Sr_(0.3)MnO_3(LSMO)是一种有趣的巨大磁阻材料,用于电子和自旋电子器件。 LSMO膜在平面磁控溅射中的现象尚未得到很好的研究,这是靶材横向不均匀腐蚀导致的横向不均匀膜特性,因此膜特性的横向分布在很大程度上取决于沉积参数。使用四点探针,振动样品磁力计和X射线衍射,研究了在64mm距离上通过直流磁控溅射在Si衬底上制备的LSMO薄膜的电,磁和结构特性的横向分布。在室温下,T_(MI)和该膜没有任何额外缓冲层的T_c分别为245K和325 K,这使它们成为基于Si的技术中的自旋源非常有趣。因此,似乎溅射沉积的LSMO是自旋电子器件的有前途的CMR材料。

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