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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Substrate dependent structural and electrical properties of Bi_2Cu_(0.1)V_(0.9)O_(5.35) solid electrolyte thin films
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Substrate dependent structural and electrical properties of Bi_2Cu_(0.1)V_(0.9)O_(5.35) solid electrolyte thin films

机译:Bi_2Cu_(0.1)V_(0.9)O_(5.35)固体电解质薄膜的基底依赖性结构和电性能

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摘要

High ion conducting room temperature stabilized gamma-Bi_2Cu_(0.1)V_(0.9)O_(5.35) has been successfully synthesized in thin film form on glass and alumina substrates. The films were characterized for their structural properties like XRD, SEM, EDAX and AFM. Bi_2Cu_(0.1)V_(0.9)O_(5.35) films deposited on alumina substrate showed single-phase nature with tetragonal crystal structure. The AFM study reveals the considerable change in growth morphology on alumina substrate. The temperature dependent ionic conductivity of Bi_2Cu_(0.1)V_(0.9)O_(5.35) films synthesized on glass and alumina substrates were studied using impedance spectroscopy. The high ionic conductivity has been observed at lower temperature for Bi_2Cu_(0.1)V_(0.9)O_(5.35) thin films synthesized on alumina substrates. With these comparisons, alumina substrate proves its candidature for deposition of Bi_2Cu_(0.1)V_(0.9)O_(5.35) films for solid oxide fuel cell applications.
机译:高离子传导室温稳定的γ-Bi_2Cu_(0.1)V_(0.9)O_(5.35)已成功地以薄膜形式在玻璃和氧化铝基板上合成。薄膜的结构特征如XRD,SEM,EDAX和AFM得以表征。沉积在氧化铝衬底上的Bi_2Cu_(0.1)V_(0.9)O_(5.35)薄膜表现出单相性质,具有四方晶体结构。原子力显微镜研究揭示了氧化铝基质上生长形态的巨大变化。利用阻抗谱研究了在玻璃和氧化铝基板上合成的Bi_2Cu_(0.1)V_(0.9)O_(5.35)薄膜的温度依赖性离子电导率。对于在氧化铝基板上合成的Bi_2Cu_(0.1)V_(0.9)O_(5.35)薄膜,在较低温度下已观察到高离子电导率。通过这些比较,氧化铝基板证明了其对于固体氧化物燃料电池应用Bi_2Cu_(0.1)V_(0.9)O_(5.35)膜沉积的候选资格。

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