...
首页> 外文期刊>Japan Chemical Week >Tokyo Ohka Unveils Photoresists for Double-patterning
【24h】

Tokyo Ohka Unveils Photoresists for Double-patterning

机译:东京Ohka推出用于双图案的光刻胶

获取原文
获取原文并翻译 | 示例
           

摘要

Tokyo Ohka Kogyo has developed two positive photoresists for highly efficient double-exposure lithography for semiconductors at the 32_nanome-ter technology node and beyond.The Tokyo-based company's photoresist for the first exposure consists of a polymer grafted with a protective group that has high resistance to etching beams.Its second-exposure photoresist is made from a polymer that tightly adheres to the substrate to be etched and minimizes the leakage of etching beams between them.The solvent contained in the second photoresist also helps to prevent failures in the first patterning and the creation of minute line/space circuit patterns,the company says.
机译:东京Ohka Kogyo在32_nanometer技术节点及以后的节点上开发了两种正性光刻胶,用于半导体的高效双曝光光刻。其第二次曝光的光致抗蚀剂是由一种聚合物制成的,该聚合物紧紧附着在要蚀刻的基板上,并最大程度地减少了它们之间的蚀刻束泄漏。该公司表示,可以创建微小的线/空间电路图案。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号