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首页> 外文期刊>Dalton transactions: An international journal of inorganic chemistry >The re-determination of the molecular structure of antimony(iii) oxide using very-high-temperature gas electron diffraction (VHT-GED)
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The re-determination of the molecular structure of antimony(iii) oxide using very-high-temperature gas electron diffraction (VHT-GED)

机译:使用高温气体电子衍射(VHT-GED)重新确定氧化锑(iii)的分子结构

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摘要

The molecular structure of a fundamental binary compound [antimony(iii) oxide] has been re-determined to a far higher accuracy and precision than previously reported. The structure is compared to those determined by various ab initio methods, X-ray diffraction and to a previous gas-phase structure determined by electron diffraction prior to modern-day developments for data extraction and manipulation. The experiments utilised a new very-high- temperature (VHT) inlet nozzle system that has been designed and constructed for the gas electron diffraction (GED) apparatus now based at the University of Canterbury (formerly at the University of Edinburgh). The VHT-GED system is capable of heating samples to temperatures of up to 1100 K. The VHT system was tested by studying the gas-phase structure of antimony(iii) oxide. Data were collected at 750 K and the contents of the gas flow analysed by mass spectrometry. In the gas phase at this temperature, antimony(iii) oxide (Sb _2O_3) exists as a dimer (Sb_4O_6) with tetrahedral symmetry. The Sb-O bond length (r_(a3,1)) was determined to be 195.66(4) pm and the O-Sb-O bond angle was 98.15(3)°. Unusually, the Sb-O bond length observed from X-ray diffraction investigation of Sb _4O_6 was longer than the gas phase bond length [197.7(1) pm as compared to 195.66(4) pm].
机译:基本二元化合物[三氧化二锑]的分子结构已被重新确定,其准确性和精密度远高于先前报道的水平。将该结构与通过各种从头算方法,X射线衍射确定的结构以及通过电子衍射在进行数据提取和处理的现代开发之前确定的先前的气相结构进行比较。实验利用了一种新的超高温(VHT)入口喷嘴系统,该系统是为现在位于坎特伯雷大学(原爱丁堡大学)的气体电子衍射(GED)设备设计和制造的。 VHT-GED系统能够将样品加热到高达1100 K的温度。通过研究氧化锑(iii)的气相结构对VHT系统进行了测试。在750 K下收集数据,并通过质谱分析气流的含量。在该温度下的气相中,氧化锑(Sb _2O_3)作为具有四面体对称性的二聚物(Sb_4O_6)存在。 Sb-O键长(r_(a3,1))确定为195.66(4)pm,O-Sb-O键角为98.15(3)°。异常地,从X射线衍射研究Sb _4O_6观察到的Sb-O键长比气相键长[197.7(1)pm与195.66(4)pm相比较]长。

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