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An investigation into different nickel and nickel-phosphorus stacked thin coatings for the corrosion protection of electrical contacts

机译:对用于电触点腐蚀防护的不同镍和镍-磷堆叠薄涂层的研究

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摘要

This paper presents an investigation on the corrosion performance of Ni/Au (NA), Ni-P/Ni/Au (PNA), Ni-P/Au (PA), Ni/Ni-P/Au (NPA) and Ni-P/Ni/Ni-P/Au (PNPA) coating stacks for electrical contact application. These five stack arrangements were exposed to sodium chloride neutral salt spray test (NSS) and mixed flowing gas test (MFG). Post-corrosion analyses were carried by X-ray diffraction, focused ion beam microscopy, scanning electron microscopy, energy dispersive spectroscopy, spectrophotometry and pits counting to evaluate the performance of each stack. Pitting behavior due to the MFG was explained through a proposed dominant pit concept. Results showed that multi-layer stacks, such as PNA, NPA, and PNPA, displayed worse corrosion resistance than single-layered stacks (NA, PA). The pitting in multi-layer stacks was attributed to the introduction of Ni and Ni-P interfaces that has accelerated the corrosion due to galvanic coupling. Removing these interfaces proved effective for corrosion prevention against NSS and MFG environments. Corrosion that occurred in the nickel layer grew horizontally while in the Ni-P penetrated vertically. This was attributed to the arrangement of Ni and Ni-P within a stack. The tunneling corrosion through the Ni-P layer became more pronounced as the Ni-P thickness was reduced, possibly due to an increase in the film porosity. (C) 2016 Elsevier B.V. All rights reserved.
机译:本文对Ni / Au(NA),Ni-P / Ni / Au(PNA),Ni-P / Au(PA),Ni / Ni-P / Au(NPA)和Ni- P / Ni / Ni-P / Au(PNPA)涂层堆栈,用于电接触应用。这五个堆放装置暴露于氯化钠中性盐雾试验(NSS)和混合流动气体试验(MFG)。通过X射线衍射,聚焦离子束显微镜,扫描电子显微镜,能量分散光谱,分光光度法和凹坑计数进行腐蚀后分析,以评估每个电池组的性能。 MFG导致的点蚀行为通过提出的显性凹坑概念进行了解释。结果表明,诸如PNA,NPA和PNPA之类的多层堆栈显示出比单层堆栈(NA,PA)更差的耐腐蚀性。多层堆叠中的点蚀归因于Ni和Ni-P界面的引入,该界面加速了由于电耦合而引起的腐蚀。事实证明,删除这些接口可有效防止NSS和MFG环境的腐蚀。镍层中发生的腐蚀水平增长,而镍磷中的腐蚀则垂直渗透。这归因于Ni和Ni-P在堆中的排列。随着Ni-P厚度的减小,穿过Ni-P层的隧道腐蚀变得更加明显,这可能是由于膜孔隙率的增加。 (C)2016 Elsevier B.V.保留所有权利。

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