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Permeation barrier coatings by inductively coupled plasma CVD on polycarbonate substrates for flexible electronic applications

机译:通过电感耦合等离子体CVD在聚碳酸酯基板上的渗透阻挡涂层,用于柔性电子应用

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摘要

Silicon oxide (SiO_x)/silicon nitride (SiN_x) stacks and parylene thin films were deposited on flexible polycarbonate (PC) substrates using inductively coupled plasma chemical vapor deposition (ICPCVD) and a parylene reactor for permeation barrier applications. The effects of gas flow ratios on SiN_x and SiO_x film properties in terms of refractive index, internal stress, and water vapor transmission rate (WVTR) were investigated. It was found that the optical property and impermeability of SiN_x and SiO_x barrier films could be tailored by varying the gas flow ratio. The details of Ar plasma treatment effects on PC substrates in terms of contact angle, roughness, and WVTR were studied. The WVTR value of the optimum barrier structure (parylene+3 pairs of SiO_x/SiN_x) could reduce to 4.74×10~(-5)g/m~2/day after bending for 1000 times under a resistivity test (25°C and 90% relative humidity). This result indicated that permeation barrier films prepared by ICPCVD could be a promising candidate for flexible electronic applications.
机译:氧化硅(SiO_x)/氮化硅(SiN_x)叠层和聚对二甲苯薄膜使用感应耦合等离子体化学气相沉积(ICPCVD)和聚对二甲苯反应器沉积在柔性聚碳酸酯(PC)基板上,用于渗透屏障应用。研究了气体流量比对SiN_x和SiO_x薄膜性能的影响,包括折射率,内应力和水蒸气透过率(WVTR)。发现可以通过改变气体流量比来调整SiN_x和SiO_x阻挡膜的光学性质和不渗透性。研究了Ar等离子体处理对PC基板的接触角,粗糙度和WVTR的影响。最佳阻隔结构(聚对二甲苯+3对SiO_x / SiN_x)的WVTR值在电阻率测试(25°C和25°C)下弯曲1000次后可降低至4.74×10〜(-5)g / m〜2 / day 90%相对湿度)。该结果表明,通过ICPCVD制备的渗透阻挡膜可以用于柔性电子应用。

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