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首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >Quantitative Analysis of Transition-Metal Migration Induced Electrochemically in Lithium-Rich Layered Oxide Cathode and Its Contribution to Properties at High and Low Temperatures
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Quantitative Analysis of Transition-Metal Migration Induced Electrochemically in Lithium-Rich Layered Oxide Cathode and Its Contribution to Properties at High and Low Temperatures

机译:富锂层状阴极中电化学诱导的过渡金属迁移的定量分析及其对高温和低温性能的贡献

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摘要

Lithium-rich layered oxides (LLOs) have attracted much attention as high-capacity electrodes in lithium-ion batteries. Especially, LLOs are known to show high performance at high temperature. The transition metal (TM) migrates from the TM layer to the Li layer in the LLO active material during the charge-discharge cycle, which complicates our understanding of its electrochemical properties. In this study, we applied X-ray diffraction spectroscopy (XDS) for acquiring quantitative data on TM migration depending on the crystallographic site in Li1.2-xNi0.13Co0.13Mn0.53O2, and we discuss their influence on the electrochemical properties at 40 and -10 degrees C. The XDS analysis shows that both Mn and Ni in the TM layer migrate to the Li layer during the charge process and return during the discharge process. This reversible migration, observed at 40 degrees C, corresponds to a high capacity. On the other hand, the operation at -10 degrees C decreases the degree of TM migration as well as the charge-discharge capacity. In particular, Mn and Ni hardly migrate to the TM layer and remain at the Li layer at the end of discharge. This clogged interlayer space, which would lower the Li+ diffusion, accounts for the capacity drop.
机译:作为锂离子电池中的高容量电极,富含锂的层状氧化物(LLO)已引起了广泛的关注。特别是,已知LLO在高温下表现出高性能。过渡金属(TM)在充放电循环中从LLO活性材料中的TM层迁移到Li层,这使我们对其电化学性质的理解更加复杂。在这项研究中,我们应用X射线衍射光谱(XDS)来获取有关TM迁移的定量数据,该数据取决于Li1.2-xNi0.13Co0.13Mn0.53O2中的晶体学位置,并讨论它们在40°C下对电化学性能的影响。 XDS分析表明,TM层中的Mn和Ni都在充电过程中迁移到Li层,并在放电过程中返回。在40摄氏度下观察到的这种可逆迁移对应于高容量。另一方面,在-10℃下的操作降低了TM迁移的程度以及充放电容量。特别地,在放电结束时,Mn和Ni几乎不迁移至TM层并保留在Li层。堵塞的层间空间会降低Li +的扩散,导致容量下降。

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