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Study of micro-pinches in wire-array Z pinches

机译:线阵列Z夹点中的微夹点研究

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Bright and hot areas with a high plasma density and temperature are observed in all kinds of Z pinches. We studied bright radiating spots produced by micro-pinches in cylindrical and planar wire-arrays at the 1 MA Zebra pulsed power generator using an x-ray streak camera synchronized with laser diagnostics, x-ray time-gated pinhole camera, and spectroscopy. Hot spots with extremely dense and relatively hot plasma arise during the collapse of the micro-pinches. These hot spots radiate a continuum spectrum with energy >2.5 keV. Typical micro-pinches in Al wire arrays generate x-ray bursts with durations of 0.4-1 ns in the soft x-ray range and 0.1-0.4 ns in the keV range. UV two-frame shadowgraphy shows spatial correlation of hot spots with the collapse and explosion of micro-pinches. Micro-pinches typically occur at the necks of the Z pinch, but can demonstrate a variety of parameters and different dynamics. An analysis of x-ray streak images shows that micro-pinches can generate >20% of the x-ray energy in some types of wire-array Z pinches.
机译:在各种Z形夹中均观察到了具有高等离子体密度和温度的明亮和高温区域。我们使用与激光诊断同步的x射线条纹相机,x射线时间选通针孔相机和光谱学,研究了在1 MA Zebra脉冲功率发生器上由圆柱形和平面线阵列中的微捏产生的亮辐射点。在微细针的坍塌过程中,出现了密度极高且相对较热的等离子体的热点。这些热点辐射能量> 2.5 keV的连续谱。 Al线阵列中的典型微夹点会产生x射线突发,其在软x射线范围内的持续时间为0.4-1 ns,在keV范围内的持续时间为0.1-0.4 ns。紫外线两帧影线显示热点与微夹点的崩溃和爆炸的空间相关性。微型捏通常出现在Z形捏的颈部,但可以显示出各种参数和不同的动态特性。对X射线条纹图像的分析表明,在某些类型的线阵列Z收缩中,微捏可产生> 20%的X射线能量。

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