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首页> 外文期刊>Physical Review, B. Condensed Matter >Electron-electron scattering rate in thin metal films - art. no. 045405
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Electron-electron scattering rate in thin metal films - art. no. 045405

机译:金属薄膜中的电子-电子散射速率-艺术。没有。 045405

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摘要

The influence of the thickness of a metal film on the electron-electron scattering rate is studied in the framework of the jellium model. It is shown that a one-dimensional confinement of the electrons in the film results in a scattering rate increase by Deltav(k)/l, where v(k) is some anisotropic function of excitation wave vector k, and l is the film thickness. Our calculations show that this increase can be of the order of the bulk scattering rate itself for few-nanometer-thick films. This fact should be taken into account when interpreting experiments with ultrathin films. [References: 21]
机译:在Jelium模型的框架内研究了金属膜厚度对电子-电子散射速率的影响。结果表明,薄膜中电子的一维约束导致散射速率增加了Deltav(k)/ l,其中v(k)是激发波矢量k的各向异性函数,而l是薄膜厚度。我们的计算表明,对于几纳米厚的薄膜,这种增加可能约为体积散射率本身。在解释超薄膜实验时应考虑到这一事实。 [参考:21]

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