...
首页> 外文期刊>Physical Review, B. Condensed Matter >Electron mobility measurement in n-GaAs at low-temperature impurity breakdown
【24h】

Electron mobility measurement in n-GaAs at low-temperature impurity breakdown

机译:n-GaAs在低温杂质击穿下的电子迁移率测量

获取原文
获取原文并翻译 | 示例

摘要

Using a combination of the standard Hall technique and the photoluminescence imaging of galvanomagentic transport, free-electron density and mobility have been measured in the regime of filamentary current flow after the electric breakdown of n-GaAs at the temperature of liquid helium. The data show good agreement with those acquired by the geometrical magnetoresistance effect and by the optical Hall angle measurement. By comparing the mobilities obtained by independent techniques, arguments have been found indicating significant neutral impurity scattering in the post-breakdown regime. In the pre-breakdown regime variable range hopping has been concluded as the dominant transport mechanism. [References: 30]
机译:结合标准霍尔技术和电致发光传输的光致发光成像,在液氦温度下n-GaAs电击穿后,在丝状电流流态下测量了自由电子密度和迁移率。数据显示与通过几何磁阻效应和通过光学霍尔角测量获得的数据吻合良好。通过比较通过独立技术获得的迁移率,已发现论点表明在分解后的过程中存在明显的中性杂质散射。在崩溃前的体制中,可变范围跳变已被认为是主要的运输机制。 [参考:30]

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号