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Ab initio study of atomic geometry, electronic states, and bonding for H2S adsorption on III-V semiconductor (110)-(1x1) surfaces

机译:从头开始研究原子几何,电子态以及在III-V半导体(110)-(1x1)表面上H2S吸附的键合

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Ab initio calculations, based on pseudopotentials and the density-functional theory, have been made to investigate the equilibrium atomic geometry, electronic states, and bonding of the H2S molecule on the InP(110), GaAs(110), and GaP(110) surfaces within a dissociative adsorption model. In general, the adsorption of H2S on the three semiconductors shows similar behavior. The calculated average distances between the topmost InP, GaAs, and GaP layer and the sulfur atom are 1.87, 1.67, and 1.65 Angstrom, respectively. in all the cases studied here, the fundamental band gap is free of surface states, with an occupied surface stare close to the valence-band maximum. The calculated electronic states are in agreement with reported angle-resolved photoemission data. [S0163-1829(98)04208-8]. [References: 24]
机译:已基于伪势和密度泛函理论进行了从头计算,以研究InP(110),GaAs(110)和GaP(110)上的平衡原子几何,电子态以及H2S分子的键合离解吸附模型中的表面。通常,H2S在三种半导体上的吸附表现出相似的行为。最上层的InP,GaAs和GaP层与硫原子之间的平均距离分别为1.87、1.67和1.65埃。在这里研究的所有情况下,基带隙都没有表面态,占据的表面凝视接近价带最大值。计算出的电子状态与报告的角度分辨的光发射数据一致。 [S0163-1829(98)04208-8]。 [参考:24]

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