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首页> 外文期刊>Physica, B. Condensed Matter >On the theory of classical cyclotron resonance line broadening in two- and three-dimensional semiconductors
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On the theory of classical cyclotron resonance line broadening in two- and three-dimensional semiconductors

机译:关于二维和三维半导体中经典回旋共振线展宽的理论

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A broadening of the absorption line of the classical cyclotron resonance (CR) in two- and three-dimensional semiconductors with neutral impurities of arbitrary depth is investigated. A dependence of the half-width of the classical CR line on the impurity characteristics (depth and range of the potential) is obtained in the wide range of the parameters. The broadening is studied within the Born approximation, and also at resonant and non-resonant scattering. Fundamental differences between the line broadening by neutral impurities in two- and three-dimensional semiconductors are revealed. An alternative explanation of classical experiments on electron scattering by neutral impurities (donors) is proposed.
机译:研究了具有任意深度的中性杂质的二维和三维半导体中经典回旋共振(CR)吸收线的拓宽。在宽范围的参数中,可以获得经典CR线的半宽度与杂质特性(电位的深度和范围)的相关性。在Born近似范围内,以及在共振和非共振散射下研究了展宽。揭示了二维和三维半导体中被中性杂质加宽的线之间的根本差异。提出了关于中性杂质(给体)电子散射的经典实验的另一种解释。

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