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首页> 外文期刊>Physical chemistry chemical physics: PCCP >Enhanced photocurrent density of hematite thin films on FTO substrates: effect of post-annealing temperature
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Enhanced photocurrent density of hematite thin films on FTO substrates: effect of post-annealing temperature

机译:FTO基板上赤铁矿薄膜的光电流密度提高:退火后温度的影响

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摘要

Fluorine doped tin oxide (FTO) is widely used as a substrate in the synthesis of a photo-reactive semiconductor electrode for solar water splitting. The hematite film on the surface of the FTO substrate annealed at 700 degrees C showed an enhanced photocurrent value with a maximum photocurrent of 0.39 mA cm(-2) at 1.23 V vs. RHE under 1 sun illumination. This is a much enhanced photocurrent value of the hematite films than that of those annealed at temperatures lower than 700 degrees C. This is a promising approach for the enhancement of the photoelectrochemical properties of metal oxide thin films. This work reports on the mechanism of the annealing process of the synthesized hematite film to enhance the photocurrent value. Furthermore, this can be used for the enhanced efficiency of the solar water splitting reaction.
机译:掺氟氧化锡(FTO)被广泛用作合成用于太阳能水分解的光反应半导体电极的基材。 FTO基板表面经过700℃退火的赤铁矿薄膜在1个日光照射下,相对于RHE的最大光电流为1.23 V,最大电流为0.39 mA cm(-2)。与在低于700摄氏度的温度下退火的赤铁矿薄膜相比,这是赤铁矿薄膜的光电流值大大提高的方法。这是增强金属氧化物薄膜的光电化学性能的有前途的方法。这项工作报道了合成赤铁矿薄膜退火过程提高光电流值的机理。此外,这可以用于提高太阳能水分解反应的效率。

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