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首页> 外文期刊>Physical chemistry chemical physics: PCCP >The structure and formation of hydrogen-bonded molecular networks on Au(111) surfaces revealed by scanning tunnelling and torsional-tapping atomic force microscopy
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The structure and formation of hydrogen-bonded molecular networks on Au(111) surfaces revealed by scanning tunnelling and torsional-tapping atomic force microscopy

机译:扫描隧道和扭转攻丝原子力显微镜揭示了Au(111)表面氢键分子网络的结构和形成

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The comment on our recent paper has raised a number of interesting issues to which we would like to provide a response. First, we would like to reiterate that the main focus of our article was to analyse the PTCDI-melamine network using two complementary scanning probe techniques; namely scanning tunnelling microscopy (STM) (as employed in the work of Madueno et al) and atomic force microscopy (AFM). To date, publications on this molecular system have relied on STM, either in UHV or ambient environments, as the only microscopy method. Although, on this system, STM typically delivers superior lateral resolution compared to AFM, its reliance on the formation of a tunnelling current across a nanoscale gap to an underlying conducting substrate means that it provides little insight into the structure of thicker insulating films formed, for example, by the presence of multilayers, and is inherently limited in this respect It has been known, for example, since the late 80's that STM will penetrate multilayers of insulating liquid crystal material to image an ordered interface on graphite, which hence can appear as an ordered monolayer at that surface. In these cases, the STM travelled through layers of material until it reached a pre-set current value between the tip and conducting substrate. In contrast, AFM has the potential to interrogate the top surface of thicker films as no such current is required, only a force interaction between the probe and the analysed surface. A previous study from our laboratory on a similar network to that of PTCDI-melamine formed by trimesic acid on HOPG surface clearly demonstrated this point AFM showed the presence of 4 layers, whereas STM only observed one. In conclusion, we believe that the use of STM alone makes the unequivocal assignment of monolayer film formation problematic.
机译:对我们最近一篇论文的评论提出了许多有趣的问题,我们希望对此做出回应。首先,我们要重申,本文的主要重点是使用两种互补的扫描探针技术分析PTCDI-三聚氰胺网络。即扫描隧道显微镜(STM)(在Madueno等人的工作中使用)和原子力显微镜(AFM)。迄今为止,有关该分子系统的出版物仅依靠STM(无论是在特高压还是在周围环境中)作为唯一的显微镜检查方法。尽管在该系统上,STM通常提供比AFM更高的横向分辨率,但它依赖于跨纳米级间隙形成隧道电流到下层导电衬底的形成,因此对于形成的较厚绝缘膜的结构了解甚少,对于例如,由于存在多层,并且固有地在这方面受到限制,例如,自80年代末以来,已知STM将穿透绝缘液晶材料的多层以在石墨上成像有序界面,因此可以显示为在该表面有序的单层。在这些情况下,STM穿过材料层,直到达到尖端和导电基材之间的预设电流值为止。相反,AFM可能会询问较厚膜的顶面,因为不需要这种电流,只需要探针与被分析表面之间的力相互作用即可。我们实验室先前的研究与由HOPG表面上的偏苯三酸形成的PTCDI-三聚氰胺类似,但清楚地证明了这一点,AFM显示存在4层,而STM仅观察到了这一层。总之,我们认为单独使用STM会使单层膜形成的明确分配成为问题。

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