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Systematic error analysis and correction in quadriwave lateral shearing interferometer

机译:四波横向剪切干涉仪的系统误差分析与校正

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To obtain high-precision and high-resolution measurement of dynamic wavefront, the systematic error of the quadriwave lateral shearing interferometer (QWLSI) is analyzed and corrected. The interferometer combines a chessboard grating with an order selection mask to select four replicas of the wavefront under test. A collimating lens is introduced to collimate the replicas, which not only eliminates the coma induced by the shear between each two replicas, but also avoids the astigmatism and defocus caused by CCD tilt. Besides, this configuration permits the shear amount to vary from zero, which benefits calibrating the systematic errors. A practical transmitted wavefront was measured by the QWLSI with different shear amounts. The systematic errors of reconstructed wavefronts are well suppressed. The standard deviation of root mean square is 0.8 nm, which verifies the stability and reliability of QWLSI for dynamic wavefront measurement (C) 2016 Elsevier B.V. All rights reserved.
机译:为了获得高精度和高分辨率的动态波前测量,对四波横向剪切干涉仪(QWLSI)的系统误差进行了分析和校正。干涉仪结合了棋盘光栅和阶数选择掩模,以选择被测波前的四个副本。引入准直透镜以使复制品准直,这不仅消除了每两个复制品之间的剪切引起的昏迷,而且避免了由CCD倾斜引起的像散和散焦。此外,该配置允许剪切量从零变化,这有利于校准系统误差。 QWLSI用不同的剪切量测量了实际的透射波前。重构波前的系统误差得到了很好的抑制。均方根的标准偏差为0.8 nm,这验证了用于动态波前测量的QWLSI的稳定性和可靠性(C)2016 Elsevier B.V.保留所有权利。

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