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首页> 外文期刊>Optics Communications: A Journal Devoted to the Rapid Publication of Short Contributions in the Field of Optics and Interaction of Light with Matter >Electrooptic coefficient measurements by Mach Zehnder interferometric method: Application of Abeles matrix formalism for thin film polymeric sample description
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Electrooptic coefficient measurements by Mach Zehnder interferometric method: Application of Abeles matrix formalism for thin film polymeric sample description

机译:Mach Zehnder干涉法测量电光系数:Abeles矩阵形式学在薄膜聚合物样品描述中的应用

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摘要

In Mach-Zehnder interferometric (MZI) method for determination of thin organic film electrooptic (EO) coefficients r_(13) and r_(33) critical effects, like multiple internal reflections and sample thickness modulation due to electrostriction and piezoelectricity are usually overlooked. Ignoring these effects may lead to inaccurate calculation of EO coefficients from experimental data by the simplified equations. To describe the influence of the above mentioned effects on the output of a MZI containing a thin film polymer sample we have used the Abeles matrix formalism.
机译:在Mach-Zehnder干涉(MZI)方法中,确定有机薄膜电光(EO)系数r_(13)和r_(33)的临界效应通常被忽略,例如由于电致伸缩和压电引起的多次内部反射和样品厚度调制。忽略这些影响可能会导致无法通过简化的公式从实验数据中计算出EO系数。为了描述上述影响对包含薄膜聚合物样品的MZI输出的影响,我们使用了Abeles矩阵形式。

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