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Using a cognitive endophenotype to identify risk genes for depression

机译:使用认知内表型识别抑郁症的风险基因

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摘要

We theorized the cognitive vulnerability factor featured in hopelessness theory [2] to be a novel endophenotype for depression. We investigated two possible genetic contributors to individual differences in cognitive vulnerability (and, in turn, depression): the BDNF gene and the COMT gene. Results showed that individuals (n=95) with the BDNF Val 66 genotype had significantly greater levels of cognitive vulnerability than individuals with a BDNF Met 66 genotype. In addition, among individuals with high levels of cognitive vulnerability, those with the Val 66 genotype were significantly more likely than participants with a Met 66 genotype to experience increases in depressive symptoms when faced with increased stress. The COMT gene was not associated with cognitive vulnerability or risk for depression. Results support the use of the cognitive vulnerability factor featured in hopelessness theory as an endophenotype associated with depression as well as the role of the BDNF gene in a cognitive subtype of depression.
机译:我们将绝望理论[2]中的认知脆弱性因素理论化为一种新型的抑郁内表型。我们调查了两种可能的遗传因素,它们分别导致认知脆弱性(以及抑郁症)的个体差异:BDNF基因和COMT基因。结果显示,具有BDNF Val 66基因型的个体(n = 95)比具有BDNF Met 66基因型的个体具有更高的认知脆弱性水平。此外,在认知脆弱性高的个体中,Val 66基因型的患者比Met 66基因型的患者在面临压力增加时出现抑郁症状的可能性更高。 COMT基因与认知脆弱性或抑郁风险无关。结果支持绝望理论中的认知脆弱性因子作为与抑郁症相关的内表型的使用,以及BDNF基因在抑郁症认知亚型中的作用。

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