Scanning probe microscopy: A visionary development

摘要

The development of scanning probe microscopy repositioned modern physics. When Rohrer and Binnig first used electronic tunnelling effects to image atoms and quantum states they did more than pin down theoretical hypotheses to real-world observables; the scanning tunnelling microscope fed imaginations, prompting researchers to consider new directions and possibilities [1]. As Rohrer once commented, ‘We could show that you can easily manipulate or position something small in space with an accuracy of 10 pm. . . . When you can do that, you simply have ideas of what you can do’ [2]. The development heralded a cavalry of scanning probe techniques—such as atomic force microscopy (AFM) [3–5], scanning near-field optical microscopy (SNOM) [6–8] and Kelvin probe force microscopy (KPFM) [9, 10]—that still continue to bring nanomaterials and nanoscale phenomena into fresh focus.