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Development of Carbon-Nanotube Probes for Scanning Probe Microscopy

机译:用于扫描探针显微镜的碳 - 纳米管探针的研制

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摘要

A family of fulleren including C_(60) and in addition carbon nanotubes have been discovered as new allotropes of carbon at the final stage of 20th century. These materials are characterized not only in terms of small sized shapes but also of unique electronic, electrical and mechanical properties, which are not possessed by well known carbon materials, graphite and diamond. Especially, nanotubes have several advantages to be used as the probes for scanning probe microscopy. Recently, we have developed a well controlled process to bring about carbon-nanotube probes for practical devices. The process consists of electrophoresis of the nanotubes we developed previously and handling nanotubes in a scanning electron microscope equipped with two individual manipulatable stages. In this article, we review bow nanotubes have been applied to scanning-probe-microscope probes and what have been observed by the new devices, and also view a future scope in this field.
机译:在20世纪最终阶段,已发现包括C_(60)和碳纳米管的富勒属系列,包括C_(60)和碳纳米管。 这些材料的特征不仅是小尺寸的形状,而且具有独特的电子,电气和机械性能,这是众所周知的碳材料,石墨和金刚石的独特电子,电气和机械性能。 特别是,纳米管具有用作扫描探针显微镜检查的探针的若干优点。 最近,我们开发了一个受控过程,为实用装置带来碳纳米管探头。 该方法包括我们之前开发的纳米管的电泳和在配备有两个单独的可操纵阶段的扫描电子显微镜中处理纳米管。 在本文中,我们审查了弓形纳米管已应用于扫描探针 - 显微镜探针以及新设备观察到的内容,并在此领域的未来观察范围。

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