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Broadband Phase-Sensitive Single InP Nanowire Photoconductive Terahertz Detectors

机译:宽带相位敏感单InP纳米线光电导太赫兹检测器

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摘要

Terahertz time-domain spectroscopy (THz-TDS) has emerged as a powerful tool for materials characterization and imaging. A trend toward size reduction, higher component integration, and performance improvement for advanced THz-TDS systems is of increasing interest. The use of single semiconducting nanowires for terahertz (THz) detection is a nascent field that has great potential to realize future highly integrated THz systems. In order to develop such components, optimized material optoelectronic properties and careful device design are necessary. Here, we present antenna-optimized photoconductive detectors based on single InP nanowires with superior properties of high carrier mobility (similar to 1260 cm(2) V-1 s(-1)) and low dark current (similar to 10 pA), which exhibit excellent sensitivity and broadband performance. We demonstrate that these nanowire THz detectors can provide high quality time-domain spectra for materials characterization in a THz-TDS system, a critical step toward future application in advanced THz-TDS system with high spectral and spatial resolution.
机译:太赫兹时域光谱(THz-TDS)已成为一种用于材料表征和成像的强大工具。对于先进的THz-TDS系统而言,减小尺寸,提高组件集成度和提高性能的趋势越来越引起人们的关注。太赫兹(THz)检测使用单根半导体纳米线是一个新兴领域,具有实现未来高度集成的THz系统的巨大潜力。为了开发此类组件,必须优化材料的光电性能并进行仔细的器件设计。在这里,我们介绍基于单InP纳米线的天线优化光电导检测器,其具有高载流子迁移率(类似于1260 cm(2)V-1 s(-1))和低暗电流(类似于10 pA)的优异性能,具有出色的灵敏度和宽带性能。我们证明,这些纳米线太赫兹探测器可以为THz-TDS系统中的材料表征提供高质量的时域光谱,这是未来在具有高光谱和空间分辨率的高级THz-TDS系统中应用的关键一步。

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