Investigation of surface and bulk charge traps of polyimide film by using the photo-stimulated discharge method

摘要

The spatial distribution of the charge trap depths in polyimide films was investigated by the photo-stimulated discharge (PSD) method. The charges were implanted by corona charging or electron beam irradiation. The characterizations of the PSD spectra regularly varied with the corona charging durations and the electron beam irradiation with different energy was adopted to find out the cause of the change. The experimental results show that the trap depths have a non-uniform spatial distribution along the thickness direction in polyimide films. Copyright (C) EPLA, 2015