Digital sampling Moire as a substitute for microscope scanning Moire for high-sensitivity and full-field deformation measurement at micronano scales

摘要

This study proposed to generate digital sampling Moire fringes by two-pixel down-sampling as a substitute for microscope scanning Moire fringes, and further reconstruct multiplication Moire fringes for micronano-scale deformation measurement. The displacement and strain sensitivities of the proposed reconstructed multiplication Moire method are 2 times higher in a wide field of view. Besides, two-dimensional deformation is easily measurable without rotating the sample stage or the scanning lines, no matter whether the scanning resolution is adjustable or not. As an example, the deformations of a carbon fiber reinforced plastic specimen were measured and analyzed. The proposed method effectively expands the application range of the Moire technique to deformation measurement. (C) 2016 Optical Society of America