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Absolute distance measurement using frequency-sweeping heterodyne interferometer calibrated by an optical frequency comb

机译:使用通过光学频率梳校准的扫频外差干涉仪测量绝对距离

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We present a frequency-sweeping heterodyne interferometer to measure an absolute distance based on a frequency-tunable diode laser calibrated by an optical frequency comb (OFC) and an interferometric phase measurement system. The laser frequency-sweeping process is calibrated by the OFC within a range of 200 GHz and an accuracy of 1.3 kHz, which brings about a precise temporal synthetic wavelength of 1.499 mm. The interferometric phase measurement system consisting of the analog signal processing circuit and the digital phase meter achieves a phase difference resolution better than 0.1 deg. As the laser frequency is sweeping, the absolute distance can be determined by measuring the phase difference variation of the interference signals. In the laboratory condition, our experimental scheme realizes micrometer accuracy over meter distance.
机译:我们提出了一种扫频外差式干涉仪,用于基于通过光学频率梳(OFC)和干涉式相位测量系统校准的可调频二极管激光器来测量绝对距离。激光扫频过程是通过OFC在200 GHz范围内进行校准的,精度为1.3 kHz,这带来了1.499 mm的精确时间合成波长。由模拟信号处理电路和数字相位计组成的干涉式相位测量系统可实现优于0.1度的相位差分辨率。当扫描激光频率时,可以通过测量干涉信号的相位差变化来确定绝对距离。在实验室条件下,我们的实验方案可以实现千分尺精度。

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