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Point diffraction interferometer with adjustable fringe contrast for testing spherical surfaces

机译:可调条纹对比度的点衍射干涉仪,用于测试球面

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A point diffraction interferometer (PDI) with adjustable fringe contrast is presented for the high-precision testing of spherical surfaces. The polarizing components are employed in the PDI to transform the polarization states of the test and reference beams, and a good fringe contrast can be realized by adjusting the relative intensities of interfering waves. The proposed system is compact and simple in structure, and it provides a feasible way for high-precision testing of spherical surfaces with low reflectivity. The theory of the interferometer is introduced in detail, along with the properties of optical components employed in the system, numerical analysis of systematic error, and the corresponding calibration procedure. Compared with the testing results of the ZYGO interferometer, a high accuracy with RMS value about 0.0025lambda is achieved with the proposed interferometer. Finally, the error consideration in the experiment is discussed.
机译:提出了一种可调节条纹对比度的点衍射干涉仪(PDI),用于球形表面的高精度测试。在PDI中使用偏振分量来转换测试光束和参考光束的偏振状态,并且可以通过调整干扰波的相对强度来实现良好的条纹对比度。该系统结构紧凑,结构简单,为低反射率球形表面的高精度测试提供了一种可行的方法。详细介绍了干涉仪的原理,以及系统中使用的光学组件的特性,系统误差的数值分析以及相应的校准程序。与ZYGO干涉仪的测试结果相比,所提出的干涉仪具有RMS值约为0.0025λ的高精度。最后,讨论了实验中的错误考虑。

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