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首页> 外文期刊>Analytica chimica acta >Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C_(60)~+-Ar~+ co-sputtering
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Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C_(60)~+-Ar~+ co-sputtering

机译:通过C_(60)〜+ -Ar〜+共溅射离子化的动态二次离子质谱(D-SIMS)对肽进行并行检测,定量和深度分析

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摘要

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) using pulsed C_(60)~+ primary ions is a promising technique for analyzing biological specimens with high surface sensitivities. With molecular secondary ions of high masses, multiple molecules can be identified simultaneously without prior separation or isotope labeling. Previous reports using the C_(60)~+ primary ion have been based on static-SIMS, which makes depth profiling complicated. Therefore, a dynamic-SIMS technique is reported here. Mixed peptides in the cryoprotectant trehalose were used as a model for evaluating the parameters that lead to the parallel detection and quantification of biomaterials. Trehalose was mixed separately with different concentrations of peptides. The peptide secondary ion intensities (normalized with respect to those of trehalose) were directly proportional to their concentration in the matrix (0.01 -2.5 mol%). Quantification curves for each peptide were generated by plotting the percentage of peptides in trehalose versus the normalized SIMS intensities. Using these curves, the parallel detection, identification, and quantification of multiple peptides was achieved. Low energy Ar~+ was used to co-sputter and ionize the peptide-doped trehalose sample to suppress the carbon deposition associated with C_(60)~+ bombardment, which suppressed the ion intensities during the depth profiling. This co-sputtering technique yielded steadier molecular ion intensities than when using a single C_(60)~+ beam. In other words, co-sputtering is suitable for the depth profiling of thick specimens. In addition, the smoother surface generated by co-sputtering yielded greater depth resolution than C_(60)~+ sputtering. Furthermore, because C_(60)~+ is responsible for generating the molecular ions, the dosage of the auxiliary Ar~+ does not significantly affect the quantification curves.
机译:使用脉冲C_(60)〜+初级离子的飞行时间次级离子质谱(ToF-SIMS)是用于分析具有高表面敏感性的生物标本的一种有前途的技术。使用高质量的分子二次离子,可以同时鉴定多个分子,而无需事先分离或进行同位素标记。以前使用C_(60)〜+初级离子的报道是基于静态SIMS的,这使深度剖析变得复杂。因此,这里报道了动态SIMS技术。冷冻保护剂海藻糖中的混合肽用作评估可并行检测和定量生物材料的参数的模型。海藻糖与不同浓度的肽分别混合。肽的次级离子强度(相对于海藻糖的强度标准化)与它们在基质中的浓度(0.01 -2.5 mol%)成正比。通过将海藻糖中的肽百分比与标准化的SIMS强度作图,可得出每种肽的定量曲线。使用这些曲线,可以并行检测,鉴定和定量多种肽。低能Ar〜+被用于共溅射和电离肽掺杂的海藻糖样品,以抑制与C_(60)〜+轰击相关的碳沉积,从而抑制了深度剖析过程中的离子强度。与使用单个C_(60)〜+束相比,该共溅射技术产生的分子离子强度更稳定。换句话说,共溅射适合厚样品的深度剖析。另外,与C_(60)〜+溅射相比,通过共溅射产生的更光滑的表面产生了更大的深度分辨率。此外,由于C_(60)〜+负责生成分子离子,因此辅助Ar〜+的剂量不会显着影响定量曲线。

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