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Combed Single DNA Molecules Imaged by Secondary Ion Mass Spectrometry

机译:二次离子质谱成像的精梳单DNA分子

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Studies of replication, recombination, and rearrangements at the level of individual molecules of DNA are often limited by problems of resolution or of perturbations caused by the modifications that are needed for imaging. The Combing-Imaging by Secondary Ion Mass Spectrometry (SIMS) (CIS) method helps solve these problems by combining DNA combing, cesium flooding, and quantitative imaging via the NanoSIMS 50. We show here that CIS can reveal, on the 50 nm scale, individual DNA fibers labeled with different, nonradioactive isotopes and, moreover, that it can quantify these isotopes so as to detect and measure the length of one or more short nucleic acid fragments associated with a longer fiber.
机译:在单个DNA分子水平上进行复制,重组和重排的研究通常受限于分辨率问题或由成像所需的修饰引起的扰动问题。通过二次离子质谱(SIMS)(CIS)的梳理成像,结合了DNA梳理,铯注入和通过NanoSIMS 50进行定量成像,可以帮助解决这些问题。在这里,我们证明了CIS可以显示50 nm规模的图像,用不同的非放射性同位素标记的单个DNA纤维,此外,它可以量化这些同位素,以便检测和测量与较长纤维相关的一个或多个短核酸片段的长度。

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