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Electrochemical detection of arsenic(III) using iridium-implanted boron-doped diamond electrodes

机译:铱注入硼掺杂金刚石电极对砷(III)的电化学检测

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Iridium-modified, boron-doped diamond electrodes fabricated by an ion implantation method have been developed for electrochemical detection of arsenite ( As(III)). Ir+ ions were implanted with an energy of 800 keV and a dose of 10(15) ion cm(-2). An annealing treatment at 850 degrees C for 45 min in H-2 plasma (80 Torr) was required to rearrange metastable diamond produced by an implantation process. Characterization was investigated by SEM, AFM, Raman, and X-ray photoelectron spectroscopy. Cyclic voltammetry and flow injection analysis with amperometric detection were used to study the electrochemical reaction. The electrodes exhibited high catalytic activity toward As( III) oxidation with the detection limit (S/N = 3), sensitivity, and linearity of 20 nM (1.5 ppb), 93 nA mu M-1 cm(-2), and 0.999, respectively. The precision for 10 replicate determinations of 50 mu M As(III) was 4.56% relative standard deviation. The advantageous properties of the electrodes were its inherent stability with a very low background current. The electrode was applicable for analysis of spiked arsenic in tap water containing a significant amount of various ion elements. The results indicate that the metal-implanted method could be promising for controlling the electrochemical properties of diamond electrodes.
机译:已经开发了通过离子注入方法制造的铱改性的掺硼金刚石电极,用于电化学检测砷(As(III))。 Ir +离子注入的能量为800 keV,剂量为10(15)离子cm(-2)。需要在H-2等离子体(80托)中在850摄氏度下进行45分钟的退火处理,以重新排列通过植入工艺产生的亚稳金刚石。通过SEM,AFM,拉曼和X射线光电子能谱研究了表征。循环伏安法和带安培检测的流动注射分析用于研究电化学反应。电极表现出对As(III)氧化的高催化活性,检测极限(S / N = 3),灵敏度和线性为20 nM(1.5 ppb),93 nAμM-1 cm(-2)和0.999 , 分别。 50μM As(III)的10次重复测定的相对标准偏差为4.56%。电极的有利特性是其固有的稳定性以及极低的背景电流。该电极适用于分析含有大量各种离子元素的自来水中的加标砷。结果表明,金属注入方法有望控制金刚石电极的电化学性能。

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