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Influencing Mechanism of the Selenization Temperature and Time on the Power Conversion Efficiency of Cu2ZnSn(S,Se)(4)-Based Solar Cells

机译:硒化温度和时间对基于Cu2ZnSn(S,Se)(4)的太阳能电池功率转换效率的影响机理

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Cu2ZnSn(S,Se)(4) (CZTSSe) films were deposited on the Mo-coated glass substrates, and the CZTSSe-based solar cells were successfully fabricated by a facile solution method and postselenization technique. The influencing mechanisms of the selenization temperature and time on the power conversion efficiency (PCE), short-circuit current density (J(sc)), open-circuit voltage (V-oc), and fill factor (FF) of the solar cell are systematically investigated by studying the change of the shunt conductance (G(sh)), series resistance (R-s), diode ideal factor (n), and reversion saturation current density (J(0)) with structure and crystal quality of the CZTSSe film and CZTSSe/Mo interface selenized at various temperatures and times. It is found that a Mo(S1-x,Se-x)(2) (MSSe) layer with hexagonal structure exists at the CZTSSe/Mo interface at the temperature of 500 degrees C, and its thickness increases with increasing selenization temperature and time. The MSSe has a smaller effect on the R-s, but it has a larger influence on the G(sh), n, and J(0). The PCE, V-oc, and FF change dominantly with G(sh), n, and J(0), while J(sc) changes with R-s and G(sh), but not R-s. These results suggest that the effect of the selenization temperature and time on the PCE is dominantly contributed to the change of the CZTSSe/CdS p-n junction and CZTSSe/MSSe interface induced by variation of the quality of the CZTSSe film and thickness of MSSe in the selenization process. By optimizing the selenization temperature and time, the highest PCE of 7.48% is obtained.
机译:将Cu2ZnSn(S,Se)(4)(CZTSSe)膜沉积在涂Mo的玻璃基板上,并通过简便的溶液法和后硒化技术成功制备了基于CZTSSe的太阳能电池。硒化温度和时间对太阳能电池功率转换效率(PCE),短路电流密度(J(sc)),开路电压(V-oc)和填充系数(FF)的影响机制通过研究分流电导(G(sh)),串联电阻(Rs),二极管理想因子(n)和反向饱和电流密度(J(0))与CZTSSe的结构和晶体质量的变化来系统地研究薄膜和CZTSSe / Mo界面在各种温度和时间下均硒化。发现在500摄氏度的温度下CZTSSe / Mo界面处存在具有六边形结构的Mo(S1-x,Se-x)(2)(MSSe)层,并且其厚度随着硒化温度和时间的增加而增加。 MSSe对R-s的影响较小,但对G(sh),n和J(0)的影响较大。 PCE,V-oc和FF主要随G(sh),n和J(0)改变,而J(sc)随R-s和G(sh)改变,但不随R-s改变。这些结果表明,硒化温度和时间对PCE的影响主要是由于硒化过程中CZTSSe膜质量和MSSe厚度的变化引起的CZTSSe / CdS pn结和CZTSSe / MSSe界面的变化。处理。通过优化硒化温度和时间,可以获得7.48%的最高PCE。

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