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Anomalous enhancement of Raman scattering of metal oxide film deposited on thermally treated ITO-coated glass substrates

机译:异常增强沉积在热处理过的ITO涂层玻璃基板上的金属氧化物膜的拉曼散射

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摘要

Anomalous enhancement of Raman scattering has been detected for tungsten oxide thin films deposited on indium tin oxide (ITO) coated glasses subjected to proper annealing treatment. Raman scattering enhancement is triggered by the presence of sodium oxide on the samples surface due to a thermal induced diffusion of sodium ions from the glass substrates to the upper layers as revealed by Photoelectron Spectroscopic investigations. A deeper analysis of the sample local morphology and elemental distribution is performed by Scanning Electron Microscopy with an Energy Dispersive X-ray detector.
机译:对于沉积在经过适当退火处理的氧化铟锡(ITO)涂层的玻璃上的氧化钨薄膜,已经检测到拉曼散射的异常增强。拉曼散射的增强是由样品表面上存在氧化钠引起的,这是由于钠离子从玻璃基板到上层的热诱导扩散所致,如光电子能谱研究所揭示的。通过具有能量色散X射线检测器的扫描电子显微镜对样品的局部形态和元素分布进行更深入的分析。

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