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ANALYSIS OF FABRICATION TOLERANCE BASED ON UNEVEN THICKNESS OF S118-PHOTO-RESIST

机译:基于S118光刻胶厚度不均的制版公差分析

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摘要

In this paper, we have analyzed the relationship between light propagation performance and uneven thickness of Su8-photo-resist based on EOPCB. Although spinning process is used to even the Su8-photo-resist, the obtained Su8-photo-resist is uneven, which directly affect cross-section shape of core layer. As long as we control h ∈[0,3μm] and a, b ∈ [0,2μm], light propagation performance does not affected. But, it is easy to actually fabricate EOPCB.
机译:在本文中,我们分析了基于EOPCB的Su8光致抗蚀剂的光传播性能与厚度不均匀之间的关系。尽管使用纺丝工艺使Su8光致抗蚀剂均匀,但是获得的Su8光致抗蚀剂是不均匀的,这直接影响芯层的横截面形状。只要我们控制h∈[0,3μm]和a,b∈[0,2μm],光传播性能就不会受到影响。但是,实际制造EOPCB很容易。

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