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Evaluation of the elastic modulus of thin film considering the substrate effect and geometry effect of indenter tip

机译:考虑衬底效应和压头尖端几何效应的薄膜弹性模量评估

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摘要

A method using finite element method (FEM) is proposed to evaluate the geometry effect of indenter tip on indentation behavior of film/substrate system. For the nanoindentation of film/substrate system, the power function relationship is proposed to describe the loading curve of the thin film indentation process due to substrate effect. The exponent of the power function and the maximum indentation load can reflect the geometry effect of indenter and substrate effect. In the forward analysis, FEM is used to simulate the indentation behavior of thin film with different apex angles of numerical conical indenter tip, and maximum indentation load and loading curve exponent are obtained from the numerical loading curves. Meanwhile, the dimensionless equations between the loading curve exponent, the maximum load, elastic properties of film/substrate system and apex angle of indenter are established considering substrate effect. In the reverse analysis, a nanoindentation test was performed on thin film to obtain the maximum indentation load and the loading curve exponent, and then the experimental data is substituted into the dimensionless equations. The elastic modulus of thin film and the real apex angle of indenter can be obtained by solving the dimensionless equations. The results can be helpful to the measurement of the mechanical properties of thin films by means of nanoindentation.
机译:提出了一种使用有限元方法(FEM)的方法来评估压头尖端对薄膜/基材系统压痕行为的几何效应。对于薄膜/基底系统的纳米压痕,提出了幂函数关系来描述由于基底效应而导致的薄膜压痕过程的载荷曲线。幂函数和最大压痕载荷的指数可以反映压头的几何效应和基体效应。在正向分析中,用有限元法模拟了圆锥形数字压头尖端不同顶角的薄膜的压痕行为,并从数值载荷曲线中获得了最大压痕载荷和载荷曲线指数。同时,考虑了基体效应,建立了载荷曲线指数,最大载荷,膜/基体系统的弹性,压头顶角之间的无因次方程。在逆向分析中,对薄膜进行了纳米压痕试验,以获得最大压痕载荷和载荷曲线指数,然后将实验数据代入无量纲方程。通过求解无量纲方程,可以得到薄膜的弹性模量和压头的实际顶角。结果可有助于通过纳米压痕法测量薄膜的机械性能。

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