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首页> 外文期刊>Comptes Rendus Chimie >Correlation between flat-band potential position and oxygenated termination nature on boron-doped diamond electrodes
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Correlation between flat-band potential position and oxygenated termination nature on boron-doped diamond electrodes

机译:掺硼金刚石电极上平带电势位置与含氧终止性质的相关性

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摘要

This paper deals with a study about the position of the flat-band potential and the surface chemistry of boron-doped diamond electrodes. Successive and mild anodic treatments have been performed on as-deposited electrodes, in H2SO4. From Mott— Schottky plots, flat-band potential (V_(FB)) evolution has been monitored, exhibiting successively negative then positive shifts during surface oxidation, depending on the anodic coulometric charge. Thanks to surface characterization by X-ray Photoelectron Spectroscopy (XPS), this particular evolution of V_(FB) has been related to the evolution of specific oxygen functionalities at the surface. While the general trends in the literature is to associate the V_(FB) displacement with the generation of oxygenated terminations, the results presented in this study exhibit the high sensitivity of V_(FB) to hydroxy 1 or ether groups.
机译:本文研究了硼掺杂金刚石电极平带电势的位置和表面化学性质。已在H2SO4中对沉积的电极进行了连续且温和的阳极处理。根据莫特-肖特基图,已监测到了平坦带电势(V_(FB))的演变过程,根据阳极库仑电荷,在表面氧化过程中其先后呈现出负向正移的趋势。由于通过X射线光电子能谱(XPS)对表面进行了表征,V_(FB)的这种特定演化与表面特定氧官能团的演化有关。虽然文献中的一般趋势是将V_(FB)的位移与氧化末端的产生联系起来,但本研究提出的结果显示V_(FB)对羟基1或醚基具有很高的敏感性。

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