首页> 外文期刊>Оптика и спектроскопия >NUMERICAL SIMULATION OF ELLIPSOMETRY MEASUREMENTS FOR DETERMINING RATIOS OF NONLINEAR SURFACE SUSCEPTIBILITY TENSOR COMPONENTS
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NUMERICAL SIMULATION OF ELLIPSOMETRY MEASUREMENTS FOR DETERMINING RATIOS OF NONLINEAR SURFACE SUSCEPTIBILITY TENSOR COMPONENTS

机译:椭偏测量确定非线性表面磁化率张量比的数值模拟

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摘要

Numerical experiments are outlined to verify if ratios of the nonlinear surface susceptibility tensor components, that govern second harmonic optical effects in centrosymmetric media, can be unambiguously determined by ellipsometry, using a recently proposed technique. The corresponding theoretical model considers only the effects associated with a single, nonmagnetic interface (between two centrosymmetric media) assumed to be an ideal surface, whose crystallographic point group is either 4 mm, 6 mm or ∞ mm. The objective has been to explore how both random and systematic errors in the experimental data related to the state of polarisation of the second harmonic radiation influence complex values of the ratios in this case. A procedure used for fitting the sample data is shown to deliver unambiguous results for the unknown ratios thus confirming the applicability and usefulness of the technique.
机译:概述了数值实验,以验证是否可以通过椭圆偏振法使用最近提出的技术明确确定控制中心对称介质中二次谐波光学效应的非线性表面磁化率张量的比率。相应的理论模型仅考虑与单个非磁性界面(两个中心对称介质之间)相关的效应,该界面被认为是理想表面,其晶体学点组为4 mm,6 mm或∞mm。目的是探索在这种情况下与二次谐波辐射的极化状态有关的实验数据中的随机误差和系统误差如何影响比率的复数值。显示了用于拟合样本数据的过程,可为未知比率提供明确的结果,从而确认了该技术的适用性和实用性。

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