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首页> 外文期刊>Comptes Rendus Chimie >Preparation and optical absorption of electrodeposited or sputtered, dense or porous nanocrystalline CuInS2 thin films
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Preparation and optical absorption of electrodeposited or sputtered, dense or porous nanocrystalline CuInS2 thin films

机译:电沉积或溅射,致密或多孔纳米晶CuInS2薄膜的制备和光吸收

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摘要

Copper indium disulphide thin films were obtained by one-step deposition with two different techniques. Films are synthesised by electrodeposition using a single electrolytic bath and by r.f. sputtering using a single target. Deposition rates were about 75 nm/min and 2.5—6.5 nm/min, respectively. Electrodeposited films have rough and porous surfaces, with no preferential orientation. Smooth or particle-covered surfaces were observed for sputtered films with a highly (112)-oriented chalcopyrite structure. Absorption coefficients calculated from transmittance spectra have high values in visible range. Electrodeposited samples present higher absorption coefficients on a larger wavelength range. A relationship between morphology and optical properties was found; absorption coefficients increase with porosity and roughness of the films. Band gap values of about 1.3 eV for electrodeposited and 1.5 eV for sputtered thin films were calculated.
机译:通过两种不同技术的一步沉积获得铜铟二硫化物薄膜。通过使用单个电解浴进行电沉积并通过r.f.合成膜。使用单个靶材进行溅射。沉积速率分别为约75nm / min和2.5-6.5nm / min。电沉积膜具有粗糙且多孔的表面,没有优先的取向。对于具有高度(112)取向的黄铜矿结构的溅射膜,观察到光滑或颗粒覆盖的表面。由透射光谱计算出的吸收系数在可见光范围内具有较高的值。电沉积的样品在较大的波长范围内具有较高的吸收系数。发现了形态与光学性质之间的关系。吸收系数随膜的孔隙率和粗糙度而增加。计算出电沉积的带隙值约为1.3 eV,溅射薄膜的带隙值约为1.5 eV。

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