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首页> 外文期刊>Journal of the Physical Society of Japan >Pressure-induced crossover from variable range hopping to electron-electron interaction in the organic conductor (DOET)(2)BF4
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Pressure-induced crossover from variable range hopping to electron-electron interaction in the organic conductor (DOET)(2)BF4

机译:压力引起的从可变范围跳变到有机导体(DOET)(2)BF4中的电子电子相互作用的交叉

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摘要

This paper reports the pressure effect on resistivity in the quasi two-dimensional (2D) organic conductor (DOET)(2)BF4 with orientational disorder of BF4 anions. At ambient pressure, the resistivity shows metal-insulator transition at 80 K and 2D variable range hopping (VRH) conduction below 80 K. The insulating behavior is suppressed by applying pressure and the temperature dependence of the resistivity shows the crossover from the 2D VRH to the logarithmic divergence as applied pressure increases. From the observation of the positive magnetoresistance, the logarithmic divergence of the resistivity is not attributed to the Anderson localization, but to the effect of the electron-electron interaction. This crossover is simply understood in terms of the screening effect on the random potential by increase of bandwidth due to applied pressure. It is found that a value of sheet conductance at low temperatures above 8 kbar, where the insulating state is almost suppressed, approaches to the minimum conductivity for a metallic state, sigma(min) = e(2)/h = 1/(25.8k Omega), first proposed by Mott.
机译:本文报道了压力对准二维(2D)有机导体(DOET)(2)BF4中具有BF4阴离子取向紊乱的电阻率的影响。在环境压力下,电阻率在80 K时显示出金属-绝缘体的转变,而在80 K以下时发生2D可变范围跳变(VRH)传导。通过施加压力抑制了绝缘行为,并且电阻率的温度依赖性显示了从2D VRH过渡到随着施加压力的增加,对数发散。从正磁阻的观察,电阻率的对数发散不是归因于安德森局部化,而是归因于电子-电子相互作用的作用。根据由于施加压力引起的带宽增加对随机电位的屏蔽效应,可以简单地理解这种交叉。结果发现,在8 kbar以上的低温下(几乎抑制了绝缘状态)的薄层电导值接近金属状态的最小电导率,sigma(min)= e(2)/ h = 1 /(25.8) k Omega),由Mott首先提出。

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