首页> 外文期刊>Journal of Tribology >Measurement and Prediction of Tape Cupping Under Mechanical and Hygrothermal Loads and Its Influence on Debris Generation in Linear Tape Drives
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Measurement and Prediction of Tape Cupping Under Mechanical and Hygrothermal Loads and Its Influence on Debris Generation in Linear Tape Drives

机译:机械和湿热载荷下磁带杯的测量和预测及其对线性磁带机中碎屑产生的影响

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摘要

Magnetic tapes, which may be modeled as three-ply laminates, exhibit transverse curvature, or cupping, as manufactured and when mechanical and hygrothermal loads are applied. Among other things, this cupping affects debris generation since it influences the contact between the flawed tape edge and head, the point where much of the debris generation occurs. This influence on debris generation is demonstrated experimentally in this study. Much more debris accumulates near the tape edge-head contact than at other contact locations. No difference in debris generation was found for two tapes with slightly different residual cupping (which is controlled during manufacturing). The target residual cupping is usually negative, which means that the tape bows out towards the tape so that the edges are farther away from the head than the center of contact is, so as to reduce contact pressure with the tape edges. However, cupping generally changes upon application of a tension and generally reduces the importance of residual cupping, which accounts for the failure to find a difference in debris generation for tapes with slightly different residual cupping. A finite element method model that uses laminate shell elements and accounts for in-plane stress stiffening, thus making it suitable for thin laminate modeling, was created. This modeling demonstrates that application of tensile and normal (used to simulate head contact) loads leads to cupping movement in the positive direction, which indicates a more severe edge contact, for an increase in front coat Young's modulus and/or an increase in front coat thickness. The same trends hold for an increase in back coat Young's modulus and/or an increase in back coat thickness. Modeling also demonstrates that cupping moves in the positive direction for an increase in the substrate's Young's modulus in the transverse direction for MP and ME tapes. An analytical model demonstrates that increases in temperature and front coat thermal expansion coefficient leads to cupping movement in the negative direction. The same trends hold for changes in relative humidity.
机译:可以建模为三层层压板的磁带在制造时以及在施加机械和湿热载荷时会表现出横向弯曲或杯状。除其他事项外,此拔罐会影响碎屑的产生,因为它会影响有缺陷的磁带边缘与磁头之间的接触,在该点上会产生大量碎屑。在这项研究中实验证明了这种对碎片产生的影响。磁带边缘头接触点附近堆积的碎屑多于其他接触点。对于残留杯形稍有不同的两个胶带(在制造过程中进行控制),未发现碎屑产生差异。目标残余拔罐通常为负,这意味着胶带向胶带弯曲,因此边缘比接触中心更远离磁头,从而降低了与胶带边缘的接触压力。但是,拔罐通常在施加张力时发生变化,并且通常降低了残留拔罐的重要性,这说明了对于残留拔罐略有不同的磁带,无法找到碎屑产生的差异。创建了一个有限元方法模型,该模型使用层压板壳单元并考虑了面内应力刚度,因此使其适合薄层压板建模。该模型表明,施加拉伸载荷和法向载荷(用于模拟头部接触)会导致正杯状运动,这表明边缘接触更加严重,从而导致前涂层杨氏模量增加和/或前涂层增加厚度。背涂层的杨氏模量增加和/或背涂层的厚度增加也具有相同的趋势。模型还表明,对于MP和ME胶带,拔罐沿正方向移动,从而使基材的杨氏模量沿横向增加。分析模型表明,温度和前涂层热膨胀系数的增加会导致拔罐向负方向移动。相对湿度的变化也遵循相同的趋势。

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