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首页> 外文期刊>Journal of the Korean Physical Society >Characteristic evaluation of a novel CdTe photon counting detector for X-ray imaging
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Characteristic evaluation of a novel CdTe photon counting detector for X-ray imaging

机译:新型CdTe光子计数探测器的X射线成像特性评估

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摘要

The purpose of this paper is to investigate the characteristics of a novel cadmium-telluride (CdTe) photon counting detector optimized for X-ray imaging applications. CdTe was studied as a potential detector material for hard X-ray and gamma-ray detection. In this study, we used a CdTe photon counting detector manufactured by AJAT Ltd. (PID 350, Finland) for the purposes of both X-ray and gamma-ray detection. However, it is noted that X-ray detection can be limited by the characteristics of gamma-ray detectors. For the investigation of the characteristics of a detector for X-ray imaging, the detector has been studied in terms of detector calibration, count rate, and pixel sensitivity variation by using a poly-energetic X-ray. The detector calibration was evaluated to determine the effects of offset, gain, and energy. An optimal calibration increases the accuracy of the output energy spectrum. The pixel sensitivity variation was evaluated using profiles of various rows and columns from white (with X-ray) and dark (without X-ray) images. The specific trend of each image was observed around the edges of the hybrids. These pixel variations of the CdTe sensor were corrected. The image quality was improved by using the optimal correction method based on an understanding of the pixel sensitivity variation. The maximum recorded count rate of the detector was measured in all pixels. The count rate was measured by setting the energy windows from just above the noise level to the maximum energy. The average count rate was fairly linear up to 1.6 × 10~6 cps/8 modules and saturated at about 2.2 × 10~6 cps/8 modules. In this paper, we present several characteristics of the detector and demonstrate the improved spectrum and image obtained after calibration and correction. These results show that the novel CdTe photon counting detector can be used in conventional X-ray imaging, but exhibits limitations when applied to spectral X-ray imaging.
机译:本文的目的是研究针对X射线成像应用而优化的新型碲化镉(CdTe)光子计数检测器的特性。研究了CdTe作为用于硬X射线和伽马射线检测的潜在检测器材料。在这项研究中,我们使用AJAT Ltd.(芬兰PID 350)制造的CdTe光子计数检测器进行X射线和伽马射线检测。但是,应注意的是,X射线检测可能受到伽马射线检测器的特性的限制。为了研究用于X射线成像的检测器的特性,已经通过使用多能X射线对检测器进行了检测器校准,计数率和像素灵敏度变化方面的研究。对检测器校准进行评估以确定偏移,增益和能量的影响。最佳校准可提高输出能谱的准确性。使用白色(使用X射线)和黑暗(没有X射线)图像的各种行和列的轮廓来评估像素灵敏度的变化。在杂种的边缘附近观察到每个图像的特定趋势。 CdTe传感器的这些像素变化已得到纠正。通过使用基于像素灵敏度变化的了解的最佳校正方法,可以改善图像质量。检测器在所有像素中记录的最大记录计数率。通过将能量窗口从刚好高于噪声水平设置为最大能量来测量计数率。平均计数率在高达1.6×10〜6 cps / 8个模块时呈线性,并在约2.2×10〜6 cps / 8个模块时达到饱和。在本文中,我们介绍了检测器的一些特性,并演示了经过校正和校正后获得的改进的光谱和图像。这些结果表明,新颖的CdTe光子计数检测器可用于常规X射线成像,但在应用于光谱X射线成像时会出现局限性。

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