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首页> 外文期刊>Journal of the European Ceramic Society >Microstructure and electrical property of aluminum doped zinc oxide ceramics by isolating current under spark plasma sintering
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Microstructure and electrical property of aluminum doped zinc oxide ceramics by isolating current under spark plasma sintering

机译:放电等离子体烧结电流隔离铝掺杂氧化锌陶瓷的微观结构和电性能

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The present paper reports a method for sintering conductive aluminum doped zinc oxide (AZO) ceramics by isolating the current from sample during SPS. It is shown that isolating the current from AZO ceramics during SPS has a significant influence on the grain growth and dislocation defects which dominate the electrical property of ceramics. With isolating the current from AZO ceramics during SPS, the grain size of AZO and a secondary phase ZnAl2O4 is obvious greater than that of samples prepared with current passing through, especially for the sintering temperature of 1200 degrees C. Furthermore, less dislocation defects in AZO ceramics is observed by isolating the current from AZO ceramics. Hall mobility of aluminum doped zinc oxide ceramics has been greatly improved reaching the value of 107.3 cm(2) V-1 s(-1) attributed by the large grain size of ZnO and secondary phase as well as less dislocation defects. The superior electronic transport property with such high vale of Hall mobility ultimately results in a fairly low resistivity of 6.7 x 10(-4) Omega cm compared to 1.3 x 10(-3) Omega cm reported in the literature for AZO fabricated by spark plasma sintering. (C) 2016 Elsevier Ltd. All rights reserved.
机译:本文报道了一种通过在SPS期间从样品中隔离电流来烧结导电铝掺杂氧化锌(AZO)陶瓷的方法。结果表明,在SPS期间从AZO陶瓷中隔离电流对决定陶瓷电性能的晶粒生长和位错缺陷具有重大影响。通过在SPS期间从AZO陶瓷隔离电流,AZO和第二相ZnAl2O4的晶粒尺寸明显大于通过电流制备的样品的晶粒尺寸,尤其是对于1200摄氏度的烧结温度。此外,AZO中的位错缺陷更少通过从AZO陶瓷隔离电流来观察陶瓷。铝掺杂的氧化锌陶瓷的霍尔迁移率已大大提高,达到107.3 cm(2)V-1 s(-1)的值,这归因于ZnO和第二相的大晶粒尺寸以及较少的位错缺陷。具有如此高的霍尔迁移率的优异电子传输性能最终导致6.7 x 10(-4)Ω厘米的电阻率相当低,而文献中报道的通过火花等离子体制造的AZO的电阻率为1.3 x 10(-3)Ω厘米烧结。 (C)2016 Elsevier Ltd.保留所有权利。

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