...
首页> 外文期刊>Journal of the Chinese Institute of Chemical Engineers >Kinetic analysis of the hydrogen oxidation reaction at Nafion film covered Pt-black rotating disk electrodes
【24h】

Kinetic analysis of the hydrogen oxidation reaction at Nafion film covered Pt-black rotating disk electrodes

机译:Nafion膜覆盖的Pt黑色旋转盘电极上氢氧化反应的动力学分析

获取原文
获取原文并翻译 | 示例
           

摘要

The kinetics of the H2 oxidation reaction at Nafion film covered Pt-black rotating disk electrodes (RDEs) in 0.5 M H2SO4 at 298 K was investigated by varying the Pt loading, Nafion film thickness, and rotating rate. The equation describing the H2 oxidation kinetics at an RDE with a NAfion film covered porous Pt layer was derived, assuming a Tafel-Volmer mechanism and taking into account the mass transfer resistances in the aqueous electrolyte, Nafion film, and Pt layer. The H2 oxidation reaction at the Pt layer was proved to be reversible and the measurable current density was determined entirely by the mass transfer of H2 in the aqueous electrolyte and the NAfion film; the apparent kinetic current density measured was due to the experimental error. More accurate results of kinetic analysis were obtained in this work than our results reported previously. (c) 2008 Taiwan Institute of Chemical Engineers. Published by Elsevier B.V. All rights reserved.
机译:通过改变Pt的负载量,Nafion膜的厚度和转速,研究了Nafion膜在0.5 M H2SO4中的Nafion膜覆盖的Pt黑色旋转盘电极(RDE)上H2氧化反应的动力学。推导了Tafel-Volmer机理,并考虑了水性电解质,Nafion膜和Pt层中的传质阻力,得出了描述在用Nafion膜覆盖多孔Pt层的RDE处H2氧化动力学的方程式。事实证明,Pt层上的H2氧化反应是可逆的,并且可测量的电流密度完全取决于水性电解质和NAfion膜中H2的传质。所测量的表观动电流密度归因于实验误差。在这项工作中获得的动力学分析结果比以前报道的结果更准确。 (c)2008台湾化学工程师学会。由Elsevier B.V.发布。保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号