Epitaxial Growth of CeO{sub}2/YSZ/CeO{sub}2 Buffer Layers on Textured Ni Substrates for YBCO Conductors

摘要

CeO{sub}2/YSZ/CeO{sub}2 buffer layers were deposited on textured Ni substrates by in situ pulsed laser deposition. The out-of-plane texture and in-plane texture of, the buffer layers were characterized by X-ray diffraction ω-scans and φ-scans. Using this CeO{sub}2/YSZ/CeO{sub}2 architecture as the buffer layers, high quality YBCO films with a zero-resistance T{sub}c about 90 K and a self-field critical current densities J{sub}c above 10{sup}6 A/cm{sup}2 at 77 K can be obtained on Ni substrates.